Faculty Mentor
Sanichiro Yoshida
Location
Memorial Gym
Start Date
20-4-2012 2:30 PM
End Date
20-4-2012 3:30 PM
Description
A Michelson Interferometer is used to evaluate the adhesion strength of thin-film systems. The specimens (gold-coated silicon wafers) are configured as the end mirrors and are driven from rear with an acoustic transducer so that the specimens oscillate parallel to optical axis at moderate frequencies. The resulting film surface displacement is detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging system. The difference in adhesion strength between two types of specimens is successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern quantifies the fringe contrast.
Characterization of Thin-Film Adhesion with Michelson Interferometer
Memorial Gym
A Michelson Interferometer is used to evaluate the adhesion strength of thin-film systems. The specimens (gold-coated silicon wafers) are configured as the end mirrors and are driven from rear with an acoustic transducer so that the specimens oscillate parallel to optical axis at moderate frequencies. The resulting film surface displacement is detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging system. The difference in adhesion strength between two types of specimens is successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern quantifies the fringe contrast.
Comments
Poster presentation