Document Type
Article
Publication Date
2-15-1982
Abstract
Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2-Si film-substrate system at the 6328-Å He-Ne laser wavelength.
Journal Name
Applied Optics
Recommended Citation
A.-R. M. Zaghloul and R. M. A. Azzam, "Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices," Appl. Opt. 21, 739-743 (1982)
Comments
This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-4-739. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.