Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2-Si film-substrate system at the 6328-Å He-Ne laser wavelength.
A.-R. M. Zaghloul and R. M. A. Azzam, "Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices," Appl. Opt. 21, 739-743 (1982)