Document Type
Article
Publication Date
5-2005
Abstract
Regular nanosized structures are considered to be promising materials for magnetic information storage media with high density of information. Recently attention was paid to static and dynamic magnetic properties arising from dimensional confinement in such nanostructures. Here we present an investigation of permalloy antidot arrays of different thicknesses. Thin permalloy films of thickness ranging from 10 to 500 nm were deposited on anoporous Al2O3 membranes with a pore size of 100 nm. It was found that additional ferromagnetic resonance peaks appear for film thicknesses below 100 nm, while films with larger thicknesses show resonance properties similar to continuous films. A comparison between the films deposited onto Si wafers and porous media was done. An evolution of the domain structures observed in MFM experiments was confirmed by micromagnetic calculations.
Journal Name
Journal of Applied Physics
Recommended Citation
Andriy Vovk, Leszek Malkinski, Vladimir Golub, Scott Whittenburg, and Charles O’Connor, Jin-Seung Jung, Suk-Hong Min. "Preparation, structural characterization, and dynamic properties investigation of permalloy antidot arrays." Journal of Applied Physics 97: 10J506.