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An achromatic infrared (λ = 1.2–4 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried Si–SiO2 interface at an angle of incidence φ near 33°, where ∂Δ/∂φ = 0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.

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Journal of the Optical Society of America A


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