Document Type
Article
Publication Date
10-2004
Abstract
An achromatic infrared (λ = 1.2–4 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried Si–SiO2 interface at an angle of incidence φ near 33°, where ∂Δ/∂φ = 0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.
Journal Name
Journal of the Optical Society of America A
Recommended Citation
R. M. A. Azzam and Cristina L. Spinu, "Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface," J. Opt. Soc. Am. A 21, 2019-2022 (2004)
Comments
This paper was published in Journal of the Optical Society of America A and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website:http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-21-10-2019. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.