Document Type
Article
Publication Date
6-6-2008
Abstract
Conditions for reducing the reflectance of a dielectric-conductor interface for p- and s-polarized light to a minimum at any angle of incidence ϕ are determined. The refractive indices of a transparent immersion medium (liquid) that achieve minimum reflectance at normal incidence, ϕ=0, and at ϕ=45° are independent of polarization. These indices provide sufficient data to determine the real and imaginary parts of the complex refractive index of an absorbing substrate. Reflection at a dielectric-Au interface at 500 nm wavelength is considered as an example. It is shown that the lowest possible reflectance is attained for p-polarized light at ϕ=45° and that the associated p-reflection phase shift is also minimum at that angle. For ϕ≥65° the lowest reflectance of p-polarized light occurs when the ambient is vacuum or air. However, this lowest reflectance at the air-Au interface is not a true minimum in a mathematical sense.
Journal Name
Applied Optics
Recommended Citation
R. M. A. Azzam and A. Alsamman, "Quasi index matching for minimum reflectance at a dielectric-conductor interface for obliquely incident p- and s-polarized light," Appl. Opt. 47, 3211-3215 (2008).
Comments
This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-17-3211. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.