Document Type
Article
Publication Date
2-15-1987
Abstract
An absorbing substrate of complex refractive index n2 - jk2 at wavelength λ can be coated by an absorbing thin film of complex refractive index n1 - jk1 and thickness d to achieve zero reflection at normal incidence. For given n2,k2 multiple solutions (n1,k1,d/λ) are found that correspond to infinitely many distinct antireflection layers. This is demonstrated for a Si substrate at two wavelengths (6328 and 4420 Å). The response of these absorbing antireflection layers to changes of the angle of incidence from 0 to 45° and to changes of thickness of ±10% is also determined and compared to the limting case of a nonabsorbing antireflection layer.
Journal Name
Applied Optics
Recommended Citation
R. M. A. Azzam, E. Bu-Habib, J. Casset, G. Chassaing, and P. Gravier, "Antireflection of an absorbing substrate by an absorbing thin film at normal incidence," Appl. Opt. 26, 719-722 (1987)
Comments
This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website:http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-26-4-719. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.