Document Type
Article
Publication Date
7-1999
Abstract
The angle-of-incidence dependence of the differential reflection phase shift Δ between p and s polarizations is considered a function of the real and imaginary parts of the relative complex dielectric function ε of an interface in the domain of fractional optical constants, i.e., under conditions of internal reflection. The constraint on complex ε such that oscillatory and monotonic angular responses are obtained is determined. A sensitive and stable technique, which is based on attenuated internal reflection ellipsometry between the Brewster angle and the critical angle, is proposed for measuring small induced absorption (εi∼10−5) in the medium of refraction.
Journal Name
Journal of the Optical Society of America A
Recommended Citation
R. M. A. Azzam, "Differential reflection phase shift under conditions of attenuated internal reflection," J. Opt. Soc. Am. A 16, 1700-1702 (1999)
Comments
This paper was published in Journal of the Optical Society of America A and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website:http://www.opticsinfobase.org/josaa/abstract.cfm?URI=josaa-16-7-1700. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.