Document Type

Article

Publication Date

9-15-1982

Abstract

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that any input polarization of light is preserved after two reflections at the same angle of incidence from a parallel-mirror beam displacer or an axicon. This is achieved by equalizing the net complex p and s reflection coefficients (also called the radial and azimuthal eigenvalues of an axicon) after two reflections. The net polarization-independent reflectance (insertion loss) of the device is computed and found to exceed the net minimum parallel reflectance of the uncoated device for incidence above a certain angle. Thus the dielectric films serve (1) protective, (2) polarization-corrective, and (3) reflectance-enhancement functions simultaneously. The sensitivity of the designs (deviation from the condition of polarization preservation) to small film-thickness and angle-of-incidence errors is examined. Results are presented graphically and in tables of applications of the method to beam displacers and axicons for He-Ne laser light, λ = 0.6328 µm, using Al2O3 (or Si2O3)/Al and MgF2/Al film-substrate systems, and for CO2 laser light, λ = 10.6 µm, using ZnS or ThF4 films on an Ag substrate.

Journal Name

Applied Optics

Comments

This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-18-3314. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

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