Document Type
Article
Publication Date
12-15-1983
Abstract
The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for thes polarization, and the second-Brewster angle of minimum ratio of the p and s reflectances are all determined as functions of the thickness of a transparent film coating an absorbing substrate by numerical solution of the exact equations that govern such angles of the form Re(Z′/Z) = 0, where Z = Rp, Rs, or ρ represent the complex amplitude-reflection coefficients for the p and s polarizations and their ratio (ρ =Rp/Rs), respectively, and Z′ is the angle-of-incidence derivative of Z. Results that show these angles and their associated reflectance and reflectance-ratio minima are presented for the SiO2-Si film-sibstrate system at wavelength λ = 0.6328 µm and film thickness of up to four periods (≃1.2 µm). Applications of these results are proposed in film-thickness measurement and control.
Journal Name
Applied Optics
Recommended Citation
R. M. A. Azzam and T. F. Thonn, "Pseudo-Brewster and second-Brewster angles of an absorbing substrate coated by a transparent thin film," Appl. Opt. 22, 4155-4165 (1983)
Comments
This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-24-4155 . Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.