Submissions from 1982
Polarization-preserving single-layer-coated beam displacers and axicons, R. M.A. Azzam and M. Emdadur Rahman Khan
Brewster and pseudo-Brewster angles of uniaxial crystal surfaces and their use for determination of optical properties, M. Elshazly-Zaghloul and R. M.A. Azzam
Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices, A.-R. M. Zaghloul and R. M.A. Azzam
Submissions from 1981
Contours of constant principal angle and constant principal azimuth in the complex ε plane, R. M.A. Azzam
Submissions from 1980
Determination of the optic axis and optical properties of absorbing uniaxial crystals by reflection perpendicularincidence ellipsometry on wedge samples, Rasheed M.A. Azzam
Mapping of Fresnel’s interface reflection coefficients between normal and oblique incidence: results for the parallel and perpendicular polarizations at several angles of incidence, Rasheed M.A. Azzam
Inversion of the nonlinear equations of reflection ellipsometry for uniaxial crystals in symmetrical orientations, M. Elshazly-Zaghloul and R. M.A. Azzam
Submissions from 1979
Direct relation between Fresnel’s interface reflection coefficients for the parallel and perpendicular polarizations, R. M.A. Azzam
Reflection of an electromagnetic plane wave with 0 or π phase shift at the surface of an absorbing medium, R. M.A. Azzam
Transformation of Fresnel’s interface reflection and transmission coefficients between normal and oblique incidence, R. M.A. Azzam
Submissions from 1978
Consequences of light reflection at the interface between two transparent media such that the angle of refraction is 45°, R. M.A. Azzam
Generalized ellipsometry based on azimuth measurements alone, R. M.A. Azzam
Propagation of partially polarized light through anisotropic media with or without depolarization: A differential 4 × 4 matrix calculus, R. M.A. Azzam
Simulation of mechanical rotation by optical rotation: Application to the design of a new Fourier photopolarimeter, R. M.A. Azzam
Principal angle, principal azimuth, and principal-angle ellipsometry of film-substrate systems, R. M.A. Azzam and A.-R. M. Zaghloul
Submissions from 1977
Single-element rotating-polarizer ellipsometer for film-substrate systems, A.-R. M. Zaghloul and R. M.A. Azzam
SiO2-Si film-substrate reflection polarizers for different mercury spectral lines, A.-R. M. Zaghloul and R. M.A. Azzam
Submissions from 1976
Ellipsometer nulling: convergence and speed, Rasheed M.A. Azzam, D. L. Confer, and N. M. Bashara
Frequency-mixing detection (FMD) of polarization-modulated light, R. M.A. Azzam
Modulated generalized ellipsometry, R. M.A. Azzam
Submissions from 1975
Combined reflection and transmission thin-film ellipsometry: a unified linear analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, and N. M. Bashara
Application of generalized ellipsometry to anisotropic crystals, R. M.A. Azzam and N. M. Bashara
Design of film-substrate single-reflection linear partial polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, and N. M. Bashara